Advances in the Use of Atomic Force Microscopy as a Diagnostic Tool for Solar Cells Characterization: From Material Design to Device Applications

Simple item page
dc.contributor.authorAhia, Chinedu Christian
dc.contributor.authorMeyer, Edson L.
dc.date.accessioned2025-10-07T13:35:18Z
dc.date.available2025-10-07T13:35:18Z
dc.date.issued2023-12-03
dc.description.abstractConsiderable efforts in search for an effective characterization technique for photovoltaic devices with utmost precision is on the increase. For precise analysis and tailoring of device performance, a reliable technique is vital. Atomic force microscopy is one of the leading surface analysis techniques of choice for probing surface patterns in a variety of materials with atomic precision using a cantilever. It has evolved as a reliable technique for the investigation of subatomic scale properties of materials such as photocurrent heterogeneity, electromechanical response, charge distribution, molecular weight effects, and many other material parameters. The integration of artificial intelligence hybrid algorithms in atomic force microscope for optoelectronic device fabrication and characterization has increasingly emerged to be desirable due to its reliability and effectiveness in achieving high image resolution, automated analysis, actuation, and the coupling of manufactured units with a precision down to atomic units. In this review, an investigation of topical developments in the use of atomic force microscopy as a diagnostic tool for solar cells characterization is presented with special focus on polymer solar cells, perovskite solar cells, quantum dots-sensitized solar cells, dye-sensitized solar cells, fullerene-based solar cells, III-V-based solar cells, and silicon-based solar cells.
dc.description.sponsorshipNational Research Foundation of South Africa (grant number: 138532) and Govan Mbeki Research & Development Centre (GMRDC) at the University of Fort Hare.
dc.identifier.citationAhia, C. C., & Meyer, E. L. (2023). Advances in the use of atomic force microscopy as a diagnostic tool for solar cells characterization: From material design to device applications. Physica Status Solidi. A, Applications and Materials Science, 221(3), n/a. https://doi.org/10.1002/pssa.202300293
dc.identifier.issn1862-6319
dc.identifier.urihttp://hdl.handle.net/20.500.11837/3250
dc.language.isoen
dc.publisherWiley
dc.subjectatomic force microscopies
dc.subjectcharacterizations
dc.subjectpolymers
dc.subjectquantum dots
dc.subjectsolar cells
dc.titleAdvances in the Use of Atomic Force Microscopy as a Diagnostic Tool for Solar Cells Characterization: From Material Design to Device Applications
dc.typeArticle
person.identifier.orcidAhia, Chinedu Christian 0000-0002-5666-1823
person.identifier.orcidMeyer, Edson L. 0000-0002-9912-311X

Files

Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
Ahia_C_&_Meyer_EL_20231203_FHIT.pdf
Size:
5.57 MB
Format:
Adobe Portable Document Format
Download
License bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description:
Download

Collections

Research Outputs